Home > Publications
Home University of Twente
Prospective Students
Intranet (internal)

EEMCS EPrints Service

Research Project: BASTION: On Board and SoC Test Instrumentation for Ageing and No-Failures Found phenomena
Home Policy Brochure Browse Search User Area Contact Help


Alt, J. and Bernardi, P. and Bosio, A. and Cantoro, R. and Kerkhoff, H.G. and Leininger, A and Molzer, W. and Motta, A. and Pacha, C. and Pagani, A and Rohani, A. and Strasser, S. (2016) Thermal issues in test: An overview of the significant aspects and industrial practice. (Invited) In: IEEE 34th VLSI Test Symposium (VTS 2016), 25-27 Apr 2016, Las Vegas, NV, USA. pp. 1-4. IEEE. ISBN 978-1-4673-8454-4
Ebrahimi, H. and Kerkhoff, H.G. (2016) Testing for intermittent resistive faults in CMOS integrated systems. In: IEEE 2016 Euromicro Conference on Digital System Design (DSD) , 31 Aug - 02 Sep 2016, Limassol, Cyprus. pp. 703-707. IEEE Circuits & Systems Society. ISBN 978-1-5090-2817-7
Ebrahimi, H. and Kerkhoff, H.G. (2016) Detecting intermittent resistive faults in digital CMOS circuits. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 19-20 Sep 2016, Storrs, CT, USA. pp. 87-90. IEEE Computer Society. ISBN 978-1-5090-3623-3
Ibrahim, A.M.Y. and Kerkhoff, H.G. (2016) Analysis and design of an on-chip retargeting engine for IEEE 1687 networks. In: 21st IEEE European Test Symposium (ETS 2016), 23-26 May 2016, Amsterdam, The Netherlands. pp. 1-6. IEEE Circuits & Systems Society. ISBN 978-1-4673-9659-2
Zhao, Yong and Kerkhoff, H.G. (2016) Highly dependable multi-processor SoCs employing lifetime prediction based on health monitors. In: 2016 IEEE 25th Asian Test Symposium (ATS), 21-24 Nov 2016, Hiroshima, Japan. pp. 228-233. IEEE Computer Society. ISSN 2377-5386 ISBN 978-1-5090-3810-7


Cantoro, R. and Sonza Reorda, M. and Rohani, A. and Kerkhoff, H.G. (2015) On the maximization of the sustained switching activity in a processor. (Invited) In: IEEE 21st International On-Line Testing Symposium, IOLST 2015, 6-8 July 2015, Halkidiki, Greece. pp. 34-35. IEEE Computer Society. ISSN 1942-9398 ISBN 978-1-4673-7905-2
Kerkhoff, H.G. and Ebrahimi, H. (2015) Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard. In: 6th Asia Symposium on Quality Electronic Design, ASQED 2015, 6-7 Aug 2015, Kuala Lumpur, Malaysia. pp. 77-82. IEEE Circuits & Systems Society. ISBN 978-1-4673-7495-8
Kerkhoff, H.G. and Ebrahimi, H. (2015) Intermittent resistive faults in digital cmos circuits. In: IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2015, 22-24 April 2015, Belgrade, Serbia. pp. 211-216. IEEE Circuits & Systems Society. ISBN 978-1-4799-6779-7
Kerkhoff, H.G. and Ebrahimi, H. (2015) Investigation of Intermittent Resistive Faults in Digital CMOS Circuits. Journal of Circuits, Systems and Computers, 25 (03). pp. 1-17. ISSN 0218-1266 *** ISI Impact 0,308 ***


Rohani, A. (2014) Modelling and mitigation of soft-errors in CMOS processors. PhD thesis, univ. of Twente. CTIT Ph.D.-thesis series No. 15-346 ISBN 9789036538077